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Development of a Fungal Risk Monitor for the next generation of intelligent containersaper


Authors

  • Blank, R.
  • Vinayaka, P. P.
  • Tahir, M. W.
  • Yong, J.
  • Vellekoop, M. J.
  • Lang, W.

Meta information [BibTeX]

  • Year: 2016, Reviewed
  • In: SENSORS, 2016 IEEE
  • Conference: SENSORS, 2016 IEEE in Orlando, Florida, USA (October 30 - November 3, 2016)
  • Publisher: IEEE
  • Pages: 658-660
  • ISBN: 978-1-4799-8288-2, eISBN: 978-1-4799-8287-5
  • DOI: 10.1109/ICSENS.2016.7808625



Arbeitsgruppe IMSAS Arbeitsgruppe IGS



Blank, R.; Vinayaka, P. P.; Tahir, M. W.; Yong, J.; Vellekoop, M. J.; Lang, W.
Development of a Fungal Risk Monitor for the next generation of intelligent containersaper
In: SENSORS, 2016 IEEE. IEEE, 2016, pp. 658-660
(Workgroups: IMSAS, IGS)
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