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Assessing the business value of RFID under uncertain conditions


Authors

  • Scholz-Reiter, B.
  • Lewandowski, M.
  • Gorldt, C.
  • Dittmer, P.

Meta information [BibTeX]

  • Year: 2008, Reviewed
  • In: 4th European Workshop on RFID Systems and Technologies (RFID SysTech), 2008
  • Conference: 4th European Workshop on RFID Systems and Technologies (RFID SysTech 2008) in Freiburg, Germany (June 10-11, 2008)
  • Publisher: VDE, Berlin
  • Pages: 1-6
  • ISBN: 978-3-8007-3106-0



Arbeitsgruppe BIBA



Scholz-Reiter, B.; Lewandowski, M.; Gorldt, C.; Dittmer, P.
Assessing the business value of RFID under uncertain conditions
In: 4th European Workshop on RFID Systems and Technologies (RFID SysTech), 2008. VDE, Berlin, 2008, pp. 1-6
(Workgroup: BIBA)
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